The Westar Micro Display Inspection
System (MDIS) is an optical test and
inspection system capable of
performing complex reflectance and
colorimetric measurements and
blemish and defect detection on
Liquid-Crystal-On-Silicon (LCOS)
microdisplays. The display test
engineer or operator can perform
accurate defect and reflectance
measurements, including spectral
response, uniformity, contrast
ratio, gamma, pixel defect and
others. Custom test sequences and
proprietary testing procedures can
be easily implemented using Westar’s
MicroPoint™ system software.
For more information,
click here
to download the MDIS brochure,
email
our product manager, or call us at
(636) 300-5115.
Typical Applications:
Micro Display R&D, Device
Characterization, Optical Throughput
Measurements, Low Rate Production
Testing, QA/QC Testing
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2001 - 2007